590 search results - page 89 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
ICCV
2005
IEEE
14 years 9 months ago
2005
IEEE
We propose a novel framework to build descriptors of local intensity that are invariant to general deformations. In this framework, an image is embedded as a 2D surface in 3D spac...
IBPRIA
2007
Springer
14 years 1 months ago
2007
Springer
In this paper we present a novel method for reducing false positives in breast mass detection. Our approach is based on using the Two-Dimensional Principal Component Analysis (2DPC...
MICAI
2007
Springer
14 years 1 months ago
2007
Springer
The wavelet transform has been used for feature extraction in many applications of pattern recognition. However, in general the learning algorithms are not designed taking into acc...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
— State of the art statistical timing analysis (STA) tools often yield less accurate results when timing variables become correlated due to global source of variations and path r...
ICRA
1998
IEEE
13 years 11 months ago
1998
IEEE
Abstract--Manufacturing scheduling is an important but difficult task. In order to effectively solve such combinatorial optimization problems, this paper presents a novel Lagrangia...