590 search results - page 8 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
VLSID
2010
IEEE
13 years 5 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
DFT
2003
IEEE
14 years 23 days ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
ICMCS
2006
IEEE
14 years 1 months ago
2006
IEEE
The study proposes a novel scheme to extract and recognize the caption contents of various sports captions. A caption extraction process based on an iteratively temporal averaging...
EDBT
2009
ACM
14 years 2 months ago
2009
ACM
In recent years, large amount of data modeled by graphs, namely graph data, have been collected in various domains. Efficiently processing queries on graph databases has attracted...
NETWORKS
2008
13 years 7 months ago
2008
We present a new efficient approach for solving the multicommodity flow problem as a sequence of subproblems, each on a very sparse but connected network. We show that each subpro...