The gap between VLSI technology and fabrication technology leads to strong refractive effects in lithography. Consequently, it is a huge challenge to reliably print layout features...
— In this paper we present a new algorithm for the Layout Optimization Problem: this concerns the placement of circular, weighted objects inside a circular container, the two obj...
Excessive power consumption is becoming a major barrier to extracting the maximum performance from high-performance parallel systems. Therefore, techniques oriented towards reduci...
In this paper, we describe a generalized approach to deriving a custom data layout in multiple memory banks for array-based computations, to facilitate high-bandwidth parallel mem...
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...