—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Bec...
This paper presents the triple jump framework for accelerating the EM algorithm and other bound optimization methods. The idea is to extrapolate the third search point based on th...
— We consider the problem of inferring sensor positions and a topological (i.e. qualitative) map of an environment given a set of cameras with non-overlapping fields of view. In...
Abstract— We are developing a swarm-intelligent inspection system based on a swarm of autonomous, miniature robots, using only on-board, local sensors. To estimate intrinsic adva...
Abstract. When a set of servers are available for a certain client-server style service, a client selects one of the servers using some server selection algorithm. The best-server ...