With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
Taniya Siddiqua, Sudhanva Gurumurthi, Mircea R. St...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Advances of sensor and RFID technology provide significant new power for humans to sense, understand and manage the world. RFID provides fast data collection with precise identific...
The issue addressed in this paper concerns the discovery of frequent multi-dimensional patterns from relational sequences. The great variety of applications of sequential pattern m...
Floriana Esposito, Nicola Di Mauro, Teresa Maria A...
: NAND flash-based solid-state drives (SSDs) are increasingly being deployed in storage systems at different levels such as buffer-caches and even secondary storage. However, the ...