1167 search results - page 221 / 234 » A Really Temporal Logic |
ISQED
2011
IEEE
13 years 10 days ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
DAC
2007
ACM
14 years 9 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
EDBT
2006
ACM
14 years 8 months ago
2006
ACM
Advances of sensor and RFID technology provide significant new power for humans to sense, understand and manage the world. RFID provides fast data collection with precise identific...
FUIN
2008
13 years 8 months ago
2008
The issue addressed in this paper concerns the discovery of frequent multi-dimensional patterns from relational sequences. The great variety of applications of sequential pattern m...
FAST
2011
13 years 4 days ago
2011
: NAND flash-based solid-state drives (SSDs) are increasingly being deployed in storage systems at different levels such as buffer-caches and even secondary storage. However, the ...