Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
Patrick Girard, Christian Landrault, Serge Pravoss...
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...