144 search results - page 4 / 29 » A Self-Test Approach Using Accumulators as Test Pattern Gene... |
133
Voted
DATE
1997
IEEE
15 years 6 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
120
Voted
VTS
1997
IEEE
15 years 6 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
132
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IOLTS
2000
IEEE
15 years 6 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
125
Voted
ICCD
2006
IEEE
15 years 11 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
145
Voted
DATE
2010
IEEE
15 years 7 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...