In this work, Self Organizing Map (SOM) is used in order to classify the types of defections in electrical systems, known as Power Quality (PQ) events. The features for classificat...
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
Michael J. Knieser, Francis G. Wolff, Christos A. ...
Data mining algorithms use various Trie and bitmap-based representations to optimize the support (i.e., frequency) counting performance. In this paper, we compare the memory requi...
This paper presents a new algorithm for feature generation, which is approximately derived based on geometrical interpretation of the Fisher linear discriminant analysis. In a fiel...
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...