219 search results - page 23 / 44 » A Simulation-Based Test Generation Scheme Using Genetic Algo... |
PADS
2006
ACM
14 years 1 months ago
2006
ACM
In this paper we present a detailed analysis of the performance of the Decision Theoretic Read Delay (DTRD) optimistic synchronisation algorithm for simulations of Multistems. We ...
CEC
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
JDWM
2007
13 years 7 months ago
2007
This article presents a new evolutionary algorithm (EA) for induction of mixed decision trees. In nonterminal nodes of a mixed tree, different types of tests can be placed, rangin...
GECCO
2010
Springer
13 years 11 months ago
2010
Springer
We use affine arithmetic to improve both the performance and the robustness of genetic programming for symbolic regression. During evolution, we use affine arithmetic to analyze e...
FPL
2004
Springer
14 years 1 months ago
2004
Springer
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...