219 search results - page 7 / 44 » A Simulation-Based Test Generation Scheme Using Genetic Algo... |
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
In the design of complex power distribution networks (PDN) with multiple power islands, it is required that the PDN represents a low impedance as seen by the digital modules. This...
CEC
2005
IEEE
14 years 1 months ago
2005
IEEE
A new radii-based evolutionary algorithm (EA) designed for multimodal optimization problems is proposed. The approach can be placed within the genetic chromodynamics framework and ...
CEC
2007
IEEE
14 years 1 months ago
2007
IEEE
— Generating test data for Object-Oriented (OO) software is a hard task. Little work has been done on the subject, and a lot of open problems still need to be investigated. In th...