420 search results - page 11 / 84 » A Small Test Generator for Large Designs |
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
TSE
2010
13 years 2 months ago
2010
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
KBSE
2007
IEEE
14 years 1 months ago
2007
IEEE
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
ATS
2003
IEEE
14 years 25 days ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...