420 search results - page 3 / 84 » A Small Test Generator for Large Designs |
BMCBI
2008
13 years 7 months ago
2008
Background: In many research areas it is necessary to find differences between treatment groups with several variables. For example, studies of microarray data seek to find a sign...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents a new method of selecting scan
ipops (FFs) in partial scan designs of sequential circuits. Scan FFs are chosen so that the whole circuit can be partitioned in...
ET
1998
13 years 7 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
IJCNN
2006
IEEE
14 years 1 months ago
2006
IEEE
—Static Var Compensator (SVC) are employed for providing better voltage regulation and transient stability especially for increased power transfer through the transmission lines....
TCAD
2002
13 years 7 months ago
2002
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...