420 search results - page 7 / 84 » A Small Test Generator for Large Designs |
COMPSAC
1999
IEEE
13 years 11 months ago
1999
IEEE
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 5 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
CSMR
2006
IEEE
14 years 1 months ago
2006
IEEE
Managing traceability data is an important aspect of the software development process. In this paper we investigate to what extent latent semantic indexing (LSI), an information r...
ITC
2003
IEEE
14 years 23 days ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...