420 search results - page 9 / 84 » A Small Test Generator for Large Designs |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
ISSRE
2000
IEEE
13 years 12 months ago
2000
IEEE
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
ICSE
2007
IEEE-ACM
14 years 7 months ago
2007
IEEE-ACM
We present a technique that improves random test generation by incorporating feedback obtained from executing test inputs as they are created. Our technique builds inputs incremen...
DM
2006
13 years 7 months ago
2006
Within a large family of crossover designs this paper characterizes the mathematical structures of A-optimal and A-efficient crossover designs for the purpose of statistical compa...
ICST
2008
IEEE
14 years 1 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...