The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a...
Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Cha...
Future process nodes have such small feature sizes that there will be an increase in the number of manufacturing defects per die. For large FPGAs, it will be critical to tolerate ...
The importance of fault tolerance at the processor architecture level has been made increasingly important due to rapid advancements in the design and usage of high performance de...
T. S. Ganesh, Viswanathan Subramanian, Arun K. Som...
In this paper, we present a new metric, Hard-Fault Architectural Vulnerability Factor (H-AVF), to allow designers to more effectively compare alternate hard-fault tolerance scheme...
Fred A. Bower, Derek Hower, Mahmut Yilmaz, Daniel ...
—Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore’s law. The first step in develo...