89 search results - page 10 / 18 » A Statistical Model for Electromigration Failures |
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...
CORR
2006
Springer
13 years 7 months ago
2006
Springer
Ideas by Statistical Mechanics (ISM) is a generic program to model evolution and propagation of ideas/patterns throughout populations subjected to endogenous and exogenous interac...
AADEBUG
1997
Springer
13 years 11 months ago
1997
Springer
Currently, few tools are available for assisting developers with debugging intelligent systems. Because these systems rely heavily on context dependent knowledge and sometimes sto...
FMOODS
2003
13 years 9 months ago
2003
Concurrent and distributed systems have traditionally been modelled using nondeterministic transitions over configurations. The minism provides an abstraction over scheduling, net...
OOPSLA
2010
Springer
13 years 6 months ago
2010
Springer
Fixing concurrency bugs (or crugs) is critical in modern software systems. Static analyses to find crugs such as data races and atomicity violations scale poorly, while dynamic a...