89 search results - page 5 / 18 » A Statistical Model for Electromigration Failures |
ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the...
ICASSP
2008
IEEE
14 years 2 months ago
2008
IEEE
Measurement and evaluation of biometric device performance is critical to end users and consumers of these devices. In this paper we present explicit theoretical correlation model...
KDD
2005
ACM
14 years 1 months ago
2005
ACM
The increasing complexity of today’s systems makes fast and accurate failure detection essential for their use in mission-critical applications. Various monitoring methods provi...
ISSRE
2006
IEEE
14 years 1 months ago
2006
IEEE
The benefits that a software organization obtains from estimates of product quality are dependent upon how early in the product cycle that these estimates are available. Early est...
DSN
2006
IEEE
14 years 1 months ago
2006
IEEE
Designing highly dependable systems requires a good understanding of failure characteristics. Unfortunately, little raw data on failures in large IT installations is publicly avai...