Statistical design and optimization of SRAM cell for yield enhancement

In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the cell failureprobability isproposed The developedmethod is used in an early stage of a design cycle to minimize memory failure probability by statistically sizing ofSRAMcell.

• Type: Conference
• Year: 2004
• Where: ICCAD
• Authors: Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy
• Keywords: Hardware, ICCAD 2004, Memory Failure Probability, Probabilities OfSRAM Cells, Process Parameter Variations