Modern integrated circuits require careful attention to the soft-error rate (SER) resulting from bit upsets, which are normally caused by alpha particle or neutron hits. These eve...
Dynamic Random Access Memory (DRAM) is used as the bulk of the main memory in most computing systems and its energy and power consumption has become a first-class design considera...
Abstract. This paper presents a case study on retrospective verication of the Linux Virtual File System (VFS), which is aimed at checking for violations of API usage rules and mem...
Continued scaling of CMOS technology to smaller transistor sizes makes modern processors more susceptible to both transient and permanent hardware faults. Circuitlevel techniques ...
Growth in the complexity of computing systems, in the dynamism of the environments they operate in, and the need for timely adaptations as conditions change, now pose significant...