226 search results - page 14 / 46 » A Study on Impact of Leakage Current on Dynamic Power |
CODES
2010
IEEE
13 years 5 months ago
2010
IEEE
Today, mobile smartphones are expected to be able to run the same complex, algorithm-heavy, memory-intensive applications that were originally designed and coded for generalpurpos...
DT
2006
13 years 7 months ago
2006
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
As transistors continue to scale down into the nanometer regime, device leakage currents are becoming the dominant cause of power dissipation in nanometer caches, making it essent...
MICRO
2006
IEEE
14 years 1 months ago
2006
IEEE
Power delivery is a growing reliability concern in microprocessors as the industry moves toward feature-rich, powerhungrier designs. To battle the ever-aggravating power consumpti...
ICC
2007
IEEE
14 years 1 months ago
2007
IEEE
—With the availability of cheap and robust wireless devices there is demand for new applications in Vehicular Ad-hoc Networks (VANET). The challenge in implementing applications ...