209 search results - page 12 / 42 » A Systematic Approach for Designing Testable VLSI Circuits |
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
GLVLSI
2000
IEEE
14 years 4 days ago
2000
IEEE
Circuit interconnect has become a substantial obstacle in the design of high performance systems. In this paper we explore a new routing paradigm that strikes at the root of the i...
NIPS
2003
13 years 9 months ago
2003
We have designed and tested a single-chip analog VLSI sensor that detects imminent collisions by measuring radially expansive optic flow. The design of the chip is based on a mode...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
Abstract--A novel input and output biasing circuit to extend the input common mode (CM) voltage range and the output swing to rail-to-rail in a low voltage op-amp in standard CMOS ...
VLSI
2007
Springer
14 years 1 months ago
2007
Springer
System design complexity is growing rapidly. As a result, current development costs are constantly increasing. It is becoming increasingly difficult to estimate how much time it ...