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» A Systematic Approach for Designing Testable VLSI Circuits
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VLSID
2007
IEEE
120views VLSI» more  VLSID 2007»
14 years 8 months ago
Statistical Leakage and Timing Optimization for Submicron Process Variation
Leakage power is becoming a dominant contributor to the total power consumption and dual-Vth assignment is an efficient technique to decrease leakage power, for which effective de...
Yuanlin Lu, Vishwani D. Agrawal
DFT
2005
IEEE
83views VLSI» more  DFT 2005»
14 years 1 months ago
An ILP Formulation for Yield-driven Architectural Synthesis
Data flow graph dominant designs, such as communication video and audio applications, are common in today’s IC industry. In these designs, the datapath resources (e.g., adders,...
Zhaojun Wo, Israel Koren, Maciej J. Ciesielski
DAC
2007
ACM
13 years 11 months ago
Statistical Framework for Technology-Model-Product Co-Design and Convergence
This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical...
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol...
DAC
2007
ACM
14 years 8 months ago
TROY: Track Router with Yield-driven Wire Planning
In this paper, we propose TROY, the first track router with yield-driven wire planning to optimize yield loss due to random defects. As the probability of failure (POF) computed f...
Minsik Cho, Hua Xiang, Ruchir Puri, David Z. Pan
VLSID
2002
IEEE
160views VLSI» more  VLSID 2002»
14 years 8 months ago
PREDICTMOS MOSFET Model and its Application to Submicron CMOS Inverter Delay Analysis
Predictive delay analysis is presented for a representative CMOS inverter with submicron device size using PREDICTMOS MOSFET model. As against SPICE, which adopts a time consuming...
A. B. Bhattacharyya, Shrutin Ulman