36 search results - page 5 / 8 » A Systematic Approach for Diagnosing Multiple Delay Faults |
CDC
2008
IEEE
13 years 9 months ago
2008
IEEE
Abstract-- Detecting and isolating multiple faults is a computationally intense task which typically consists of computing a set of tests, and then computing the diagnoses based on...
VTS
1997
IEEE
13 years 11 months ago
1997
IEEE
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...
TVLSI
2002
13 years 7 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
— To ensure security and robustness of the next generation of Physically Unclonable Functions (PUFs), we have developed a new methodology for PUF design. Our approach employs int...
MSN
2007
Springer
14 years 1 months ago
2007
Springer
Some of the routing algorithms in mobile ad hoc networks use multiple paths simultaneously. These algorithms can attempt to find nodedisjoint paths to achieve higher fault toleranc...