729 search results - page 12 / 146 » A Transitive Closure Based Algorithm for Test Generation |
ITC
1994
IEEE
13 years 11 months ago
1994
IEEE
DAGSTUHL
2004
13 years 9 months ago
2004
ASPDAC
2004
ACM
14 years 1 months ago
2004
ACM
Improving logic capacity by time-sharing, dynamically reconfigurable FPGAs are employed to handle designs of high complexity and functionality. In this paper, we use a novel topo...
ASPDAC
2004
ACM
14 years 1 months ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
JLP
2006
13 years 7 months ago
2006
We present a formal framework for notions related to testing and model based test generation for a behavioural subset of UML Statecharts (UMLSCs). This framework builds, on one ha...