729 search results - page 14 / 146 » A Transitive Closure Based Algorithm for Test Generation |
UTP
2010
13 years 5 months ago
2010
Abstract. The Unifying Theories of Programming underpins the development of Circus, a state-rich process algebra for refinement. We have previously presented a theory of testing fo...
ET
2002
13 years 7 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
EVOW
2008
Springer
13 years 9 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
ASE
2006
13 years 7 months ago
2006
Finite state machines have been used to model a number of classes of system and there has thus been much interest in the automatic generation of test sequences from finite state m...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...