729 search results - page 24 / 146 » A Transitive Closure Based Algorithm for Test Generation |
ICSE
1993
IEEE-ACM
13 years 11 months ago
1993
IEEE-ACM
We give examples of situations where formal specifications of procedures in the standard pre/postcondition style become lengthy, cumbersome and difficult to change, a problem whic...
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
3DIM
2007
IEEE
13 years 11 months ago
2007
IEEE
An algorithm is presented to estimate the position of a hand-held camera with respect to a 3d world model constructed from range data and color imagery. Little prior knowledge is ...
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
TACAS
2000
Springer
13 years 11 months ago
2000
Springer
Conformance testing is still the main industrial validation technique for telecommunication protocols. The automatic construction of test cases based on the model approach is hinde...