729 search results - page 31 / 146 » A Transitive Closure Based Algorithm for Test Generation |
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
EURODAC
1990
IEEE
13 years 11 months ago
1990
IEEE
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
SIGSOFT
2007
ACM
14 years 8 months ago
2007
ACM
With the growing complexity of web applications, identifying web interfaces that can be used for testing such applications has become increasingly challenging. Many techniques tha...
ICST
2010
IEEE
13 years 6 months ago
2010
IEEE
Abstract—In this paper we introduce Timed Moore Automata, a specification formalism which is used in industrial train control applications for specifying the real-time behavior ...
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
Constraint solving lies at the heart of several specification-based approaches to automated testing. Korat is a previously developed algorithm for solving constraints in Java pro...