729 search results - page 77 / 146 » A Transitive Closure Based Algorithm for Test Generation |
CEC
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract-- A novel algorithm to solve constrained realparameter optimization problems, based on the Artificial Bee Colony algorithm is introduced in this paper. The operators used ...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
TABLEAUX
2000
Springer
13 years 11 months ago
2000
Springer
FaCT (Fast Classification of Terminologies) is a Description Logic (DL) classifier that can also be used for modal logic satisfiability testing. The FaCT system includes two reason...
JCC
2008
13 years 7 months ago
2008
Abstract: We present a method for simultaneous three-dimensional (3D) structure generation and pharmacophorebased alignment using a self-organizing algorithm called Stochastic Prox...
ICML
2005
IEEE
14 years 8 months ago
2005
IEEE
Gaussian Process Temporal Difference (GPTD) learning offers a Bayesian solution to the policy evaluation problem of reinforcement learning. In this paper we extend the GPTD framew...