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DAC
1996
ACM
13 years 12 months ago
Characterization and Parameterized Random Generation of Digital Circuits
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
Michael D. Hutton, Jerry P. Grossman, Jonathan Ros...
BMCBI
2007
169views more  BMCBI 2007»
13 years 7 months ago
The CRISPRdb database and tools to display CRISPRs and to generate dictionaries of spacers and repeats
Background: In Archeae and Bacteria, the repeated elements called CRISPRs for "clustered regularly interspaced short palindromic repeats" are believed to participate in ...
Ibtissem Grissa, Gilles Vergnaud, Christine Pource...
DSN
2002
IEEE
14 years 19 days ago
Detecting Processor Hardware Faults by Means of Automatically Generated Virtual Duplex Systems
A virtual duplex system (VDS) can be used to increase safety without the use of structural redundancy on a single machine. If a deterministic program P is calculating a given func...
Markus Jochim
SAC
2004
ACM
14 years 1 months ago
Using semi-lagrangian formulations with automatic code generation for environmental modeling
An import issue for numerical weather prediction modes (NWP) is the time it takes to produce a valid forecast. One factor, which greatly influences this simulation time is the si...
Paul van der Mark, Lex Wolters, Gerard Cats
ICCD
2004
IEEE
134views Hardware» more  ICCD 2004»
14 years 4 months ago
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
Pallav Gupta, Rui Zhang, Niraj K. Jha