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ATS
2005
IEEE
84views Hardware» more  ATS 2005»
15 years 12 months ago
Current Testing for Nanotechnologies: A Demystifying Application Perspective.
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
Hans A. R. Manhaeve
ENTCS
2007
75views more  ENTCS 2007»
15 years 6 months ago
Testing Planning Domains (without Model Checkers)
We address the problem of verifying planning domains as used in model-based planning, for example in space missions. We propose a methodology for testing flight rules of planning...
Franco Raimondi, Charles Pecheur, Guillaume Brat
GLVLSI
2005
IEEE
99views VLSI» more  GLVLSI 2005»
15 years 12 months ago
An empirical study of crosstalk in VDSM technologies
We perform a detailed study of various crosstalk scenarios in VDSM technologies by using a distributed model of the crosstalk site and make a number of key observations about the ...
Shahin Nazarian, Massoud Pedram, Emre Tuncer
METRICS
2003
IEEE
15 years 11 months ago
When Can We Test Less?
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
Tim Menzies, Justin S. Di Stefano, Kareem Ammar, K...
CORR
2008
Springer
108views Education» more  CORR 2008»
15 years 5 months ago
Efficient Isomorphism Testing for a Class of Group Extensions
Abstract. The group isomorphism problem asks whether two given groups are isomorphic or not. Whereas the case where both groups are abelian is well understood and can be solved eff...
François Le Gall