2128 search results - page 47 / 426 » A general characterization of indulgence |
DAC
2007
ACM
14 years 12 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
PODS
2006
ACM
14 years 11 months ago
2006
ACM
Given a document D in the form of an unordered labeled tree, we study the expressibility on D of various fragments of XPath, the core navigational language on XML documents. We gi...
DAC
2009
ACM
14 years 12 months ago
2009
ACM
Elevated chip temperatures are true limiters to the scalability of computing systems. Excessive runtime thermal variations compromise the performance and reliability of integrated...
ICDT
2009
ACM
14 years 11 months ago
2009
ACM
Schema mappings are declarative specifications that describe the relationship between two database schemas. In recent years, there has been an extensive study of schema mappings a...
MICRO
2009
IEEE
14 years 5 months ago
2009
IEEE
Despite flash memory’s promise, it suffers from many idiosyncrasies such as limited durability, data integrity problems, and asymmetry in operation granularity. As architects, ...