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DAC
2001
ACM
14 years 8 months ago
Semi-Formal Test Generation with Genevieve
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking"...
Julia Dushina, Mike Benjamin, Daniel Geist
ET
2000
145views more  ET 2000»
13 years 7 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
TSE
2010
155views more  TSE 2010»
13 years 2 months ago
Incremental Test Generation for Software Product Lines
Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence to deploy more dependable software. This pap...
Engin Uzuncaova, Sarfraz Khurshid, Don S. Batory
CSB
2003
IEEE
14 years 1 months ago
Group Testing With DNA Chips: Generating Designs and Decoding Experiments
DNA microarrays are a valuable tool for massively parallel DNA-DNA hybridization experiments. Currently, most applications rely on the existence of sequence-specific oligonucleot...
Alexander Schliep, David C. Torney, Sven Rahmann
ISSTA
2006
ACM
14 years 1 months ago
Path-oriented random testing
Test campaigns usually require only a restricted subset of paths in a program to be thoroughly tested. As random testing (RT) offers interesting fault-detection capacities at low ...
Arnaud Gotlieb, Matthieu Petit