43 search results - page 5 / 9 » A new class of linear feedback shift register generators |
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
ICCD
2002
IEEE
14 years 4 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
CRYPTO
2000
Springer
13 years 11 months ago
2000
Springer
The task of a fast correlation attack is to efficiently restore the initial content of a linear feedback shift register in a stream cipher using a detected correlation with the out...
VTS
1995
IEEE
13 years 11 months ago
1995
IEEE
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
DAC
2003
ACM
14 years 21 days ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...