43 search results - page 6 / 9 » A new class of linear feedback shift register generators |
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
CRYPTO
2000
Springer
13 years 11 months ago
2000
Springer
Abstract. This paper investigates the design of S-boxes used for combining linear feedback shift register (LFSR) sequences in combination generators. Such combination generators ha...
IMA
2009
Springer
14 years 2 months ago
2009
Springer
Cache timing attacks are a class of side-channel attacks that is applicable against certain software implementations. They have generated significant interest when demonstrated ag...
TCAD
2002
13 years 7 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
MTDT
2000
IEEE
13 years 12 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...