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TVLSI
2008
105views more  TVLSI 2008»
13 years 7 months ago
Fast Estimation of Timing Yield Bounds for Process Variations
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
Ruiming Chen, Hai Zhou
JCP
2008
114views more  JCP 2008»
13 years 7 months ago
Statistical Analysis and Data Analysis of Stock Market by Interacting Particle Models
The statistical analysis of Chinese stock market fluctuations modeled by the interacting particle systems has been done in this paper. The contact model and voter model of the inte...
Jun Wang, Bingli Fan, Tiansong Wang
DATE
2008
IEEE
161views Hardware» more  DATE 2008»
14 years 1 months ago
Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression
Statistical timing analysis needs a priori knowledge of process variations. Lack of such a priori knowledge of process variations prevents accurate statistical timing analysis, fo...
Bao Liu
ICCAD
2006
IEEE
141views Hardware» more  ICCAD 2006»
14 years 4 months ago
An accurate sparse matrix based framework for statistical static timing analysis
Statistical Static Timing Analysis has received wide attention recently and emerged as a viable technique for manufacturability analysis. To be useful, however, it is important th...
Anand Ramalingam, Gi-Joon Nam, Ashish Kumar Singh,...
DATE
2007
IEEE
130views Hardware» more  DATE 2007»
14 years 1 months ago
A novel criticality computation method in statistical timing analysis
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
Feng Wang 0004, Yuan Xie, Hai Ju