126 search results - page 21 / 26 » A note on fault diagnosis algorithms |
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
AAAI
2010
13 years 8 months ago
2010
In a previous paper, Liu argued for the importance of establishing a precise theoretical foundation for program debugging from first principles. In this paper, we present a first ...
ICCAD
2002
IEEE
14 years 4 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
CORR
2002
Springer
13 years 7 months ago
2002
Springer
In order to control the process of data mining and focus on the things of interest to us, many kinds of constraints have been added into the algorithms of data mining. However, di...
SCAI
2008
13 years 8 months ago
2008
We propose a troubleshooting algorithm that can troubleshoot systems with dependent action costs. When actions are performed they may change the way the system is decomposed and af...