287 search results - page 27 / 58 » A novel improvement technique for high-level test synthesis |
CODES
2006
IEEE
14 years 1 months ago
2006
IEEE
Reliability in embedded processors can be improved by control flow checking and such checking can be conducted using software or hardware. Proposed software-only approaches suffe...
SRDS
2010
IEEE
13 years 5 months ago
2010
IEEE
Data aggregation is a fundamental building block of modern distributed systems. Averaging based approaches, commonly designated gossip-based, are an important class of aggregation ...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ICML
2007
IEEE
14 years 8 months ago
2007
IEEE
In supervised learning, we commonly assume that training and test data are sampled from the same distribution. However, this assumption can be violated in practice and then standa...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...