60 search results - page 5 / 12 » A one-shot projection method for interconnects with process ... |
SLIP
2006
ACM
14 years 1 months ago
2006
ACM
Manufacturable design requires matching of interconnects which have equal nominal dimensions. New design rules are projected to bring guarantee rules for interconnect matching. In...
SIGPRO
2010
13 years 6 months ago
2010
In this paper, an anisotropic total variation (ATV) minimization is combined with the new adaptive tetrolet transform for discontinuity-preserving image processing. In order to su...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
ICIP
2003
IEEE
14 years 9 months ago
2003
IEEE
Using a novel data dimension reduction method proposed in statistics, we develop an appearance-based face recognition algorithm which is insensitive to large variation in lighting...