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» A scalable method for the generation of small test sets
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ATS
2005
IEEE
132views Hardware» more  ATS 2005»
14 years 1 months ago
Concurrent Test Generation
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
Vishwani D. Agrawal, Alok S. Doshi
CRYPTO
2006
Springer
99views Cryptology» more  CRYPTO 2006»
13 years 11 months ago
Scalable Secure Multiparty Computation
We present the first general protocol for secure multiparty computation which is scalable, in the sense that the amortized work per player does not grow, and in some natural settin...
Ivan Damgård, Yuval Ishai
VLSID
2005
IEEE
131views VLSI» more  VLSID 2005»
14 years 8 months ago
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
FUZZIEEE
2007
IEEE
14 years 2 months ago
Self-Fuzzification Method According to Typicality Correlation for Classification on Tiny Data Sets
— This article presents a self-fuzzification method to enhance the settings of a Fuzzy Reasoning Classification adapted to the automated inspection of wooden boards. The supervis...
Emmanuel Schmitt, Vincent Bombardier, Patrick Char...
JISE
2010
144views more  JISE 2010»
13 years 2 months ago
Variant Methods of Reduced Set Selection for Reduced Support Vector Machines
In dealing with large datasets the reduced support vector machine (RSVM) was proposed for the practical objective to overcome the computational difficulties as well as to reduce t...
Li-Jen Chien, Chien-Chung Chang, Yuh-Jye Lee