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» A scalable method for the generation of small test sets
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ETS
2009
IEEE
117views Hardware» more  ETS 2009»
13 years 5 months ago
A Two Phase Approach for Minimal Diagnostic Test Set Generation
We optimize the full-response diagnostic fault dictionary from a given test set. The smallest set of vectors is selected without loss of diagnostic resolution of the given test se...
Mohammed Ashfaq Shukoor, Vishwani D. Agrawal
ETS
2009
IEEE
79views Hardware» more  ETS 2009»
13 years 5 months ago
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
Michael A. Kochte, Christian G. Zoellin, Hans-Joac...
ICST
2010
IEEE
13 years 6 months ago
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Abstract—Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the n...
Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit ...
ICASSP
2008
IEEE
14 years 2 months ago
LSF mapping for voice conversion with very small training sets
To make voice conversion usable in practical applications, the number of training sentences should be minimized. With traditional Gaussian mixture model (GMM) based techniques sma...
Elina Helander, Jani Nurminen, Moncef Gabbouj
ICSE
1997
IEEE-ACM
13 years 12 months ago
A Theory of Probabilistic Functional Testing
We propose a framework for “probabilistic functional testing.” The success of a test data set generated according to our method guarantees a certain level of confidence into ...
Gilles Bernot, Laurent Bouaziz, Pascale Le Gall