1175 search results - page 65 / 235 » A scalable method for the generation of small test sets |
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
VTS
2000
IEEE
14 years 8 days ago
2000
IEEE
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
SIGIR
2005
ACM
14 years 1 months ago
2005
ACM
Memory-based approaches for collaborative filtering identify the similarity between two users by comparing their ratings on a set of items. In the past, the memory-based approache...
CHARME
2003
Springer
14 years 1 months ago
2003
Springer
We present a non-operational approach to specifying and analyzing shared memory consistency models. The method uses higher order logic to capture a complete set of ordering constra...
BMCBI
2007
13 years 8 months ago
2007
Background: Single nucleotide polymorphisms (SNPs) and genes that exhibit presence/absence variation have provided informative marker sets for bacterial and viral genotyping. Iden...