503 search results - page 8 / 101 » A simulation model for designing the automation of future's ... |
DAC
2008
ACM
14 years 8 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
WSC
1997
13 years 9 months ago
1997
Simulation is used to evaluate parking space availability for a current layout and for future design options at Miami University. By using simulation, an alternative design that i...
WSC
2007
13 years 10 months ago
2007
Decision making in industry continues to become more complicated. Customers are more demanding, competition is more fierce, and costs for labor and raw materials continue to rise....
DAC
2008
ACM
14 years 8 months ago
2008
ACM
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
The use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design comp...