Reconfigurable high-performance computing systems (RHPC) have been attracting more and more attention over the past few years. RHPC systems are a promising solution for accelerati...
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
Elevated chip temperatures are true limiters to the scalability of computing systems. Excessive runtime thermal variations compromise the performance and reliability of integrated...
A built-in self-test (BIST) scheme is presented which both reduces overhead for detecting random-pattern-resistant (r.p.r.) faults as well as reduces power consumption during test...
The focus of this paper is on VLIW instruction scheduling that minimizes the variation of power consumed by the processor during the execution of a target program. We use rough set...