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ATS
2010
IEEE
229views Hardware» more  ATS 2010»
13 years 6 months ago
Variation-Aware Fault Modeling
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
Fabian Hopsch, Bernd Becker, Sybille Hellebrand, I...
SEW
2006
IEEE
14 years 2 months ago
Retrenching the Purse: Finite Exception Logs, and Validating the Small
The Mondex Electronic Purse is an outstanding example of industrial scale formal refinement, and was the first verification to achieve ITSEC level E6 certification. A formal a...
Richard Banach, Michael Poppleton, Susan Stepney
ECLIPSE
2007
ACM
14 years 23 days ago
An Eclipse-based tool framework for software model management
Software development involves the use of many models and Eclipse provides an ideal infrastructure for building tools to support the use of models. While there is a large selection...
Rick Salay, Marsha Chechik, Steve M. Easterbrook, ...
ASE
1998
152views more  ASE 1998»
13 years 8 months ago
Apel: A Graphical Yet Executable Formalism for Process Modeling
Software process improvement requires high level formalisms for describing project-specific, organizational and quality aspects. These formalisms must be convenient not only for ...
Samir Dami, Jacky Estublier, Mahfoud Amiour
DATE
2003
IEEE
130views Hardware» more  DATE 2003»
14 years 2 months ago
Noise Macromodel for Radio Frequency Integrated Circuits
† Noise performance is a critical analog and RF circuit design constraint, and can impact the selection of the IC system-level architecture. It is therefore imperative that some ...
Yang Xu, Xin Li, Peng Li, Lawrence T. Pileggi