167 search results - page 4 / 34 » Accounting for defect characteristics in evaluations of test... |
HICSS
2003
IEEE
14 years 20 days ago
2003
IEEE
Many software projects fail because early life-cycle defects such as ill-defined requirements are not identified and removed. Therefore, quality assurance (QA) techniques for defe...
GLVLSI
2002
IEEE
14 years 9 days ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
ETS
2007
IEEE
14 years 1 months ago
2007
IEEE
Dependability is an important attribute for microfluidic biochips that are used for safety-critical applications such as point-of-care health assessment, air-quality monitoring, a...
ISCA
2005
IEEE
14 years 29 days ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...