130 search results - page 23 / 26 » Accurate and scalable reliability analysis of logic circuits |
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— The need to perform power analysis in the early stages of the design process has become critical as power has become a major design constraint. Embedded and highperformance mic...
DAC
2010
ACM
13 years 10 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
POPL
2009
ACM
14 years 7 months ago
2009
ACM
This paper describes a compositional shape analysis, where each procedure is analyzed independently of its callers. The analysis uses an abstract domain based on a restricted frag...
IWMM
2009
Springer
14 years 1 months ago
2009
Springer
The peak heap consumption of a program is the maximum size of the live data on the heap during the execution of the program, i.e., the minimum amount of heap space needed to run t...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...