81 search results - page 12 / 17 » Accurate microarchitecture-level fault modeling for studying... |
DATE
2005
IEEE
14 years 27 days ago
2005
IEEE
Technology Roadmap for Semiconductors (ITRS) clearly identifies the integration of electrochemical and electrobiological techniques as one of the system-level design challenges tha...
ISSRE
2002
IEEE
14 years 6 days ago
2002
IEEE
We report a study to determine the impact of four types of disturbances on the failure intensity of a software product undergoing system test. Hardware failures, discovery of a cr...
IAAI
2003
13 years 8 months ago
2003
In addition to being accurate, it is important that diagnostic systems for use in automobiles also have low development and hardware costs. Model-based methods have shown promise ...
ETS
2010
IEEE
13 years 5 months ago
2010
IEEE
ÑIn this paper, we present a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering different technology nodes. In particular, we analy...
AICCSA
2006
IEEE
13 years 9 months ago
2006
IEEE
In this paper we apply a machine learning approach to the problem of estimating the number of defects called Regression via Classification (RvC). RvC initially automatically discr...