Fault tolerant measurements are an essential requirement for system identification, control and protection. Measurements can be corrupted or interrupted due to sensor failure, bro...
Wei Qiao, Zhi Gao, Ronald G. Harley, Ganesh K. Ven...
This paper presents a system-level design methodology for networked embedded systems that exploits existing data-redundancy to increase their reliability. The presented approach n...
Accurate estimation of the tick length of a synchronous program is essential for efficient and predictable implementations that are devoid of timing faults. The techniques to dete...
Partha S. Roop, Sidharta Andalam, Reinhard von Han...
Concurrency bugs are among the most difficult to test and diagnose of all software bugs. The multicore technology trend worsens this problem. Most previous concurrency bug detect...
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...