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ICONIP
2007
13 years 8 months ago
Analysis on Bidirectional Associative Memories with Multiplicative Weight Noise
Abstract. In neural networks, network faults can be exhibited in different forms, such as node fault and weight fault. One kind of weight faults is due to the hardware or software ...
Chi-Sing Leung, Pui-Fai Sum, Tien-Tsin Wong
VTS
2005
IEEE
84views Hardware» more  VTS 2005»
14 years 26 days ago
Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
Ilia Polian, Sandip Kundu, Jean Marc Galliè...
ITC
2000
IEEE
93views Hardware» more  ITC 2000»
13 years 11 months ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
DSN
2006
IEEE
14 years 1 months ago
Assessment of the Effect of Memory Page Retirement on System RAS Against Hardware Faults
The Solaris 10 Operating System includes a number of new features for predictive self-healing. One such feature is the ability of the Fault Management software to diagnose memory ...
Dong Tang, Peter Carruthers, Zuheir Totari, Michae...
ECBS
2006
IEEE
145views Hardware» more  ECBS 2006»
13 years 11 months ago
The Accuracy of Fault Prediction in Modified Code - Statistical Model vs. Expert Estimation
Fault prediction models still seem to be more popular in academia than in industry. In industry expert estimations of fault proneness are the most popular methods of deciding wher...
Piotr Tomaszewski, Jim Håkansson, Lars Lundb...