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GI
2004
Springer
14 years 26 days ago
2004
Springer
: The transition from microelectronics to nanoelectronics reaches physical limits and results in a paradigm shift in the design and fabrication of electronic circuits. The conserva...
DATE
2010
IEEE
14 years 18 days ago
2010
IEEE
There is a growing concern about the increasing vulnerability of future computing systems to errors in the underlying hardware. Traditional redundancy techniques are expensive for...
GLVLSI
2010
IEEE
14 years 18 days ago
2010
IEEE
Processors have traditionally been designed for the worst-case, resulting in designs that have high yields, but are expensive in terms of area and power. Better-than-worst-case (B...
CLUSTER
2004
IEEE
13 years 11 months ago
2004
IEEE
As high performance clusters continue to grow in size, the mean time between failure shrinks. Thus, the issues of fault tolerance and reliability are becoming one of the challengi...
CASES
2008
ACM
13 years 9 months ago
2008
ACM
Although CMOS feature size scaling has been the source of dramatic performance gains, it has lead to mounting reliability concerns due to increasing power densities and on-chip te...