21183 search results - page 168 / 4237 » Adaptive Testing by Test |
148
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VLSID
2002
IEEE
16 years 5 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
116
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ATS
2009
IEEE
15 years 11 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
136
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ICST
2009
IEEE
15 years 11 months ago
2009
IEEE
Software products released into the field typically have some number of residual defects that either were not detected or could not have been detected during testing. This may be...
136
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ASYNC
2006
IEEE
15 years 10 months ago
2006
IEEE
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...
139
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APSEC
2005
IEEE
15 years 10 months ago
2005
IEEE
A test oracle is a mechanism that is used during testing to determine whether a software component behaves correctly or not. The test oracle problem is widely acknowledged in the ...